In order to perform a functional simulation of the storage reliability of the radio fuze, it is first necessary to obtain the change rule of the parameters of the radio fuze electronic components with storage time under general conditions, and it is necessary to establish an accelerated life test model and determine the acceleration coefficient of the electronic components. During storage, slow physical and chemical changes will occur on the surface and inside of electronic components. These changes will cause various functional characteristics of electronic components to change, which is also the main reason for the failure of electronic components during non-working periods. With the increase of these physical and chemical changes, the performance of electronic components deteriorates (generally manifested as changes in functional parameters). When the performance degrades to a certain degree, the components will fail. The magnitude of various stresses on electronic components determines the rate of these physical and chemical changes. According to the definition of the reaction theory model (when the reaction to materials and components continues to a certain limit, failure will occur. The reaction here refers not only to a narrow chemical reaction, such as evaporation, deformation, condensation and other physical changes with a certain speed and heat, (Electricity, mass diffusion, etc. all belong to the category of reaction theory) It can be seen that electronic components conform to this model regardless of the general state or the accelerated life test state. In the storage state of the radio fuze, since the fuze is well sealed, the main environmental stress suffered is temperature. This model can also be used in the accelerated life test of electronic components using temperature as the environmental stress. Determining the acceleration coefficient of the function-degraded accelerated life test under temperature stress In order to deduce the performance change law of electronic components under the general state through the accelerated life test results, it is necessary to find the accelerated life coefficient under the accelerated life test state relative to the storage state. Blank Patch Panel,1U 12 24 Port Blank Patch Panel,Keystone Patch Panel Blank Chinasky Electronics Co., Ltd. , https://www.chinaskyswitches.com